SENSE 20 - Silicon nitride AFM probe
SENSE 20 - Silicon nitride AFM probe
Benefit from high quality imaging with our pack of 10 general purpose silicon nitride AFM probes, suitable for imaging soft samples using contact or AC mode in either air or liquid. They feature a sharp silicon tip integrated onto a silicon nitride cantilever with a gold reflective backside coating.
Spring constant: 0.07 N/m
Resonant frequency: 20 kHz
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Reliable, high quality AFM probes…
"We have tested the new NuNano SENSE 70 tips for the imaging of 2D protein arrays in aqueous environments. The performance of these tips is outstanding. We can get sub-nm resolution images routinely!"
— Dr. Peng Bao & Kyle Phillips, University of Liverpool, UK
Cantilever Specifications
Parameter | Nominal | Range |
Spring constant (N/m) | 0.07 | 0.05 - 0.10 |
Resonant frequency (kHz) | 20 | 15 - 25 |
Shape | Triangular | |
Length (µm) | 205 | 195 - 215 |
Width (µm) | 25 | 23 - 28 |
Thickness (nm) | 650 | 630 - 670 |
Material | Silicon nitride |
NB. Nominal values for spring constants and resonant frequencies are calculated using well known formulae and based on expected probe dimensions. The ranges are calculated using measured dimensions.
Tip Specifications
Parameter | Nominal | Range |
Radius (nm) | 5 | < 10 |
Exposed height (µm) | 6 | 5 - 8 |
Total height (µm) | 11.5 | 10 - 13 |
Set back (µm) | 17.5 | 14.5 - 19 |
Shape | Conical | |
Cone Angle (°) | 25 | 15 - 40 |
Material | Silicon (n-type, Antimony) | |
Resistivity (Ωcm) | 0.02 | 0.015 - 0.025 |
Coating
Frontside/Tip
None
Backside/Reflective
5 nm Ti
40 nm Au
Disclaimer
At NuNano we continually strive to develop and improve our products. Consequently, Nu Nano Ltd reserves the right to change specifications without notice.
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